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GAIO attended ‘Embedded World’

Embedded World Exhibition and Conference

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Exhibition View

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Exhibited Products


We exhibited our flagship product, Quality Town for Embedded grade (QTE), a unit test tool, and CoverageMaster winAMS.
Please refer to the product pages below.

・The next generation of Unit Test tools for C++ and Open Platforms
「QTE（Quality Town for Embedded grade）」

・The new standard for embedded software testing
「CoverageMaster winAMS」

Overview


GAIO attended the exhibition show ‘Embedded World’
held at Fachmesse in Nuremberg, Germany.

Date: 11 /Mar – 13 /Mar/2025
At: Exhibition Centre Nuremberg, Germany
GAIO TECHNOLOGY’s Booth : 「4-309, Hall 4」

→【Embedded World Official Web Page】

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